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Improved Test Method for Very Low Fatigue-Crack-Growth-Rate Data

Improved Test Method for Very Low Fatigue-Crack-Growth-Rate Data

  • Presented at Forum 64
  • 8 pages
  • SKU # : 64-2008-000037

  • Your Price : $30.00

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Improved Test Method for Very Low Fatigue-Crack-Growth-Rate Data

Authors / Details: Newman, James; Ruschau, John